SILICON-BASED INTEGRATED MOSFETS AND MESFETS: A NEW PARADIGM FOR LOW POWER, MIXED SIGNAL, MONOLITHIC SYSTEMS USING COMMERCIALLY AVAILABLE SOI

Author:

YANG JINMAN1,BALIJEPALLI ASHA1,THORNTON TREVOR J.1,VANDERSAND JAMES2,BLALOCK BENJAMIN J.2,WOOD MICHAEL E.3,MOJARRADI MOHAMMAD M.4

Affiliation:

1. Arizona State University, Dept. of Electrical Engineering, PO Box 876206, Tempe, AZ 85287-6206, USA

2. The University of Tennessee, Dept. of Electrical and Computer Engineering, Knoxville, TN 37996-2100, USA

3. SPAWAR Systems Center – Code 2876, 49375 Ashburn Rd. San Diego, CA 92152-7633, USA

4. Jet Propulsion Laboratory, California Institute of Technology, 4800 Oak Grove Drive, Mail Stop 303-300, Pasadena CA 91109-8099, USA

Abstract

Metal Semiconductor Field Effect Transistors fabricated using compound semiconductor materials have important applications in high-speed/low-noise communication systems. However, their integration densities are low compared to silicon technologies, and it is difficult to combine them with conventional CMOS for single-chip, mixed-signal circuit applications. In this paper we describe how silicon-on-insulator MESFETs can be fabricated alongside conventional MOSFETs using a commercially available silicon-on-insulator foundry. The process flow for the integrated MOSFETS and MESFETs is presented. Measurements from MESFETs fabricated using a commercial foundry demonstrate good depletion-mode device operation. The measured data confirms a square-law behavior for the saturated drain current, which can be reproduced using readily available MESFET models for Spice circuit simulation. The Spice model is applied to a simple differential-pair amplifier and the modeled results compared to measured data.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Electronic, Optical and Magnetic Materials

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