POTENTIAL PROFILE MEASUREMENT OF CARBON NANOTUBE FETs BASED ON THE ELECTROSTATIC FORCE DETECTION-Reference-Cited by-同舟云学术

POTENTIAL PROFILE MEASUREMENT OF CARBON NANOTUBE FETs BASED ON THE ELECTROSTATIC FORCE DETECTION

Published:2008-02 Issue:01 Volume:03 Page:51-54
ISSN:1793-2920
Container-title:Nano
language:en
Short-container-title:NANO

Author:

OKIGAWA YUKI¹,UMESAKA TAKEO¹,OHNO YUTAKA¹,KISHIMOTO SHIGERU¹²,MIZUTANI TAKASHI¹

Affiliation:

1. Department of Quantum Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan

2. Venture Business Laboratory, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan

Abstract

We have measured the potential distribution on carbon nanotube (CNT) field-effect transistors (FETs) using electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KFM). Clearer potential profiles were obtained by EFM than by KFM. When the CNT-FET is in the ON state, the EFM image shows uniform potential distribution along the CNT. In contrast, when the CNT-FET is in the OFF state, nonuniform potential image with dark spots are obtained. The dark spots can be attributed to the defects in the CNTs.

Publisher

World Scientific Pub Co Pte Lt

Subject

Condensed Matter Physics,General Materials Science

Link

https://www.worldscientific.com/doi/pdf/10.1142/S1793292008000812

Reference13 articles.

1. Mixing at 50GHz using a single-walled carbon nanotube transistor

2. Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

3. Electrostatic force microscopy studies of surface defects on GaAs/Ge films

4. Contact Potential Measurement of Carbon Nanotube by Kelvin Probe Force Microscopy

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