Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.363884
Reference23 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
2. Atomic Force Microscope
3. Interpretation issues in force microscopy
4. Atomic resolution imaging of a nonconductor by atomic force microscopy
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