Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces-Reference-Cited by-同舟云学术

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Adhesion Microscopy as a Nanoscale Probe for Oxidation and Charge Generation at Metal-Oxide Interfaces

Published:2023-08-29 Issue:9 Volume:5 Page:5176-5186
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Ranjan Alok¹²^ORCID,Padovani Andrea³,Dianat Behnood⁴,Raghavan Nagarajan²^ORCID,Pey Kin Leong²^ORCID,O’Shea Sean J.⁵^ORCID

Affiliation:

1. Division of Nano-and-Bio Physics, Department of Physics, Chalmers University of Technology, Gothenburg 41296, Sweden

2. Engineering Product Development, Singapore University of Technology and Design, 487372 Singapore

3. Dipartimento di Ingegneria Enzo Ferrari, University of Modena and Reggio Emilia, Modena 41125, Italy

4. Dipartimento di Scienze e Metodi dell’Ingegneria, University of Modena and Reggio Emilia, Modena 42122, Italy

5. Institute of Materials Research and Engineering, Agency for Science Technology and Research, 2 Fusionopolis Way, 138634 Singapore

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.3c00903

Reference77 articles.

1. Resistive Random Access Memory (RRAM): an Overview of Materials, Switching Mechanism, Performance, Multilevel Cell (mlc) Storage, Modeling, and Applications

2. A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐ k , and Layered Dielectrics

3. Reversible oxygen migration and phase transitions in hafnia-based ferroelectric devices

4. Oxygen Chemisorption, Formation, and Thermal Stability of Pt Oxides on Pt Nanoparticles Supported on SiO2/Si(001): Size Effects

5. Progress in material selection for solid oxide fuel cell technology: A review

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1. Estimating the Number of Defects in a Single Breakdown Spot of a Gate Dielectric;IEEE Electron Device Letters;2024-05

2. Direct visualization and 3D reconstruction of conductive filaments in aSiO₂ material-based memristive device;Physical Chemistry Chemical Physics;2024

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