A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐ k , and Layered Dielectrics-Reference-Cited by-同舟云学术

A Review on Dielectric Breakdown in Thin Dielectrics: Silicon Dioxide, High‐ k , and Layered Dielectrics

Published:2019-04-30 Issue:18 Volume:30 Page:1900657
ISSN:1616-301X
Container-title:Advanced Functional Materials
language:en
Short-container-title:Adv. Funct. Mater.

Author:

Palumbo Felix¹^ORCID,Wen Chao²,Lombardo Salvatore³,Pazos Sebastian¹,Aguirre Fernando¹,Eizenberg Moshe⁴,Hui Fei²⁴⁵,Lanza Mario²

Affiliation:

1. Unidad de Investigación y Desarrollo de las Ingenierías‐CONICETFacultad Regional Buenos AiresUniversidad Tecnológica Nacional (UIDI‐CONICET/FRBA‐UTN) Medrano 951 (C1179AAQ) Buenos Aires Argentina

2. Institute of Functional Nano and Soft MaterialsCollaborative Innovation Center of Suzhou Nanoscience & TechnologySoochow University 199 Ren‐Ai Road Suzhou 215123 China

3. Istituto per la Microelettronica e Microsistemi (IMM) Consiglio Nazionale delle Ricerche (CNR)Zona Industriale Ottava Strada, 5 95121 Catania Italy

4. Department of Materials Science and EngineeringTechnion–Israel Institute of Technology Haifa 32000 Israel

5. Department of Materials Science and EngineeringGuangdong Technion—Israel Institute of Technology 241 Daxue Road 515063 Shantou China

Funder

Ministerio de Ciencia, Tecnología e Innovación Productiva

Ministry of Education of the People's Republic of China

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Ministry of Finance

Publisher

Wiley

Subject

Electrochemistry,Condensed Matter Physics,Biomaterials,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adfm.201900657

Reference170 articles.

1. The characteristics of cloud-to-ground lightning flashes with different contacts

2. Size-dependence of the dielectric breakdown strength from nano- to millimeter scale

3. Electronic synapses made of layered two-dimensional materials

4. Electrical Breakdown in Thin Dielectric Films

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