Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy-Reference-Cited by-同舟云学术

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Determination of electrostatic force and its characteristics based on phase difference by amplitude modulation atomic force microscopy

Published:2016-12 Issue:1 Volume:11 Page:
ISSN:1931-7573
Container-title:Nanoscale Research Letters
language:en
Short-container-title:Nanoscale Res Lett

Author:

Wang Kesheng,Cheng Jia,Yao Shiji,Lu Yijia,Ji Linhong,Xu Dengfeng

Funder

No. 02 National Science and Technology Major Project of China

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,General Materials Science

Link

http://link.springer.com/content/pdf/10.1186/s11671-016-1765-2.pdf

Reference29 articles.

1. Zaghloul U, Bhushan B, Pons P, Papaioannou GJ, Coccetti F, Plana R (2011) Nanoscale characterization of different stiction mechanisms in electrostatically driven MEMS devices based on adhesion and friction measurements. J Colloid Interface Sci 358:1–13

2. Gupta S, Williams OA, Bohannan E (2007) Electrostatic force microscopy studies of boron-doped diamond films. J Mater Res 22:3014–3028

3. Jiang Y, Yue LL, Yan BS, Liu X, Yang XF, Tai GA, Song J (2015) Electric control of friction on silicon studied by atomic force microscope. Nano 10:1550038

4. Okigawa Y, Umesaka T, Ohno Y, Kishimoto S, Mizutani T (2008) Potential profile measurement of carbon nanotube FETs based on the electrostatic force detection. Nano 3:51–54

5. Inami E, Sugimoto Y (2015) Accurate extraction of electrostatic force by a voltage-pulse force spectroscopy. Phys Rev Lett 114:246102

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