Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-662-44551-8_4
Reference89 articles.
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2. Zisman W (1932) A new method of measuring contact potential differences in metals. Rev Sci Instrum 3(7):367–370
3. Melitz W, Shen J, Kummel AC, Lee S (2011) Kelvin probe force microscopy and its application. Surf Sci Rep 66(1):1–27
4. Sadewasser S, Glatzel T (2012) Kelvin probe force microscopy. Springer, Heidelberg
5. Nonnenmacher M, O’Boyle M, Wickramasinghe H (1991) Kelvin probe force microscopy. Appl Phys Lett 58:2921
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