Basal Plane Stacking-Fault Related Anisotropy in X-ray Rocking Curve Widths ofm-Plane GaN
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference17 articles.
1. Strain-induced polarization in wurtzite III-nitride semipolar layers
2. Growth of p-type and n-type m-plane GaN by molecular beam epitaxy
3. Polarization anisotropy in the electroluminescence of m-plane InGaN–GaN multiple-quantum-well light-emitting diodes
4. Structural characterization of nonpolar (112̄0) a-plane GaN thin films grown on (11̄02) r-plane sapphire
5. Structural and morphological characteristics of planar (112̄0) a-plane gallium nitride grown by hydride vapor phase epitaxy
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