Thermomigration in Pb-free SnAg solder joint under alternating current stressing
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3089872
Reference14 articles.
1. Electromigration in Flip Chip Solder Joints
2. Recent advances on electromigration in very-large-scale-integration of interconnects
3. Microstructure-electromigration correlation in a thin stripe of eutectic SnPb solder stressed between Cu electrodes
4. Electromigration issues in lead-free solder joints
5. Infrared microscopy of hot spots induced by Joule heating in flip-chip SnAg solder joints under accelerated electromigration
Cited by 58 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Inhibition of roof-type Cu6Sn5 grains on migration of Cu atoms under temperature gradient;Journal of Materials Science;2023-12-27
2. Study on Ni-GNSs enhanced Sn2.5Ag0.7Cu0.1RE/Cu solder joints β-Sn grain orientation and interfacial IMC growth kinetics under constant temperature thermomigration;Materials Characterization;2023-11
3. Thermomigration-induced failure in ball grid array solder joint under high current stressing;Journal of Materials Science;2023-06-18
4. Coupling model of electromigration and experimental verification – Part II: Impact of thermomigration;Journal of the Mechanics and Physics of Solids;2023-05
5. Measurement of the Soret coefficient in liquid Al-Ag alloys using x-ray radiography;Physical Review B;2023-02-15
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3