New diffractometer for thin‐film structure analysis under grazing incidence condition
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145978
Reference7 articles.
1. X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface
2. Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X Radiation
3. Evanescent absorption in kinematic surface Bragg diffraction
4. Anomalous Transmission in Bragg-Case Diffraction of X-Rays
5. X-RAY Determination and Analysis of Residual Stresses in Uniform Films and Patterned Lines of Tungsten
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