X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface-Reference-Cited by-同舟云学术

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X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface

Published:1979-11 Issue:11 Volume:50 Page:6927-6933
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Marra W. C.,Eisenberger P.,Cho A. Y.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.325845

Reference2 articles.

1. CXVII. The total reflexion of X-rays

2. Single‐crystal‐aluminum Schottky‐barrier diodes prepared by molecular‐beam epitaxy (MBE) on GaAs

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