Grain size effect of the flexoelectric response in BaTiO3 ceramics

Author:

Yang Xu1,Xia Baoju1ORCID,Guo Xiongxin1,Qi Yagang1,Wang Zhen2,Fu Zhenxiao3,Chen Yu2,Zuo Ruzhong4,Chu Baojin1ORCID

Affiliation:

1. CAS Key Laboratory of Materials for Energy Conversion and Department of Materials Science and Engineering, University of Science and Technology of China 1 , Hefei 230026, China

2. Institute of High Energy Physics, Chinese Academy of Sciences and Graduate, University of Chinese Academy of Sciences 2 , Beijing 100049, China

3. State Key Laboratory of Advanced Materials and Electronic Components, Guangdong Fenghua Advanced Technology Holding Co. Ltd. 3 , Zhaoqing, Guangdong 526020, China

4. School of Materials Science and Engineering, Anhui Polytechnic University 4 , Wuhu 241000, China

Abstract

Size effect is a fundamental phenomenon in ferroelectric materials and grain size dependence of the dielectric and piezoelectric properties of BaTiO3 (BTO) ceramics has been observed. However, the dependence of flexoelectric response on grain size has not been reported, thus far. In this work, BTO ceramics with grain sizes ranging from 0.59 to 8.90 μm were prepared by a two-step sintering method. We found that with increasing grain size, the flexoelectric coefficient of BTO ceramics increases from less than 20 μC/m (grain size 0.59–0.69 μm) to more than 300 μC/m (grain size 8.90 μm), but the grain size dependence of the flexoelectric response is different from that of the dielectric and piezoelectric properties. Observation by piezoresponse force microscopy reveals that the surface regions of BTO ceramics are spontaneously polarized. Strong inhomogeneous strain is measured by grazing incidence x-ray diffraction and the resultant flexoelectric effect is enough to polarize the surface regions. Fitting of the flexoelectric data indicates that the grain size effect of the flexoelectric response can be well explained by the polarized surface layer mechanism.

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

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