In situ observation of epitaxial microcrystals in thermally grown SiO2 on Si(100)
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.123953
Reference10 articles.
1. A structural study of the thermally oxidized Si(001) wafer by X-ray CTR scattering
2. X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO2thin films on the Si(001) surface
3. Structure of silicon oxide on Si(001) grown at low temperatures
4. Observation of a Distributed Epitaxial Oxide in Thermally Grown SiO2on Si(001)
5. High‐precision x‐ray reflectivity study of ultrathin SiO2 on Si
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2. Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate;AIP Advances;2012-12
3. The structure of the SiO2∕Si(100) interface from a restraint-free search using computer simulations;Applied Physics Letters;2006-01-02
4. Reactions and diffusion of atomic and molecular oxygen in theSiO2network;Physical Review B;2005-07-13
5. Synchrotron x-ray studies of vitreousSiO2over Si(001). II. Crystalline contribution;Physical Review B;2005-01-13
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