Synchrotron x-ray studies of vitreousSiO2over Si(001). II. Crystalline contribution-Reference-Cited by-同舟云学术

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Synchrotron x-ray studies of vitreousSiO2over Si(001). II. Crystalline contribution

Published:2005-01-13 Issue:4 Volume:71 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Castro-Colin M.,Donner W.,Moss S. C.,Islam Z.,Sinha S. K.,Nemanich R.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.71.045311/fulltext

Reference32 articles.

1. A structural study of the thermally oxidized Si(001) wafer by X-ray CTR scattering

2. X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO2thin films on the Si(001) surface

3. Observation of a Distributed Epitaxial Oxide in Thermally Grown SiO2on Si(001)

4. The thermal oxidation of silicon the special case of the growth of very thin films

5. Si→SiO2transformation: Interfacial structure and mechanism

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1. Tailoring Phase Distribution of Quasi‐2D Perovskites via Taurine‐Assistance Enables Efficient Blue Light‐Emitting Diodes;Small;2023-09

2. Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate;AIP Advances;2012-12

3. High Mobility Indium Zinc Oxide Thin Film Field-Effect Transistors by Semiconductor Layer Engineering;ACS Applied Materials & Interfaces;2012-11-30

4. Order and disorder in edge-supported pure amorphous Si and pure amorphous Si on Si(001);Journal of Non-Crystalline Solids;2011-07

5. Stability-instability transition of reaction fronts in thermal oxidation of silicon;Physical Review B;2009-06-22

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