Single-electron tunneling to insulator surfaces detected by electrostatic force
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1525886
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1. Spatial location of electron trapping defects on silicon by scanning tunneling microscopy
2. Nonlinear alternating-current tunneling microscopy
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5. Single electron tunneling detected by electrostatic force
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4. Measurement of depth and energy of buried trap states in dielectric films by single electron tunneling force spectroscopy;Applied Physics Letters;2011-01-31
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