High resolution Fowler‐Nordheim field emission maps of thin silicon oxide layers-Reference-Cited by-同舟云学术

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High resolution Fowler‐Nordheim field emission maps of thin silicon oxide layers

Published:1996-01 Issue:1 Volume:68 Page:93-95
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Ruskell Todd G.,Workman Richard K.,Chen Dong,Sarid Dror,Dahl Sarah,Gilbert Stephen

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.116782

Reference10 articles.

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