Atomic scale trap state characterization by dynamic tunneling force microscopy-Reference-Cited by-同舟云学术

Atomic scale trap state characterization by dynamic tunneling force microscopy

Published:2014-08-04 Issue:5 Volume:105 Page:052903
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Wang R.¹,King S. W.²,Williams C. C.¹

Affiliation:

1. Department of Physics and Astronomy, University of Utah, Salt Lake City, Utah 84112, USA

2. Logic Technology Development, Intel Corporation, Hillsboro, Oregon 97124, USA

Funder

Semiconductor Research Corporation (SRC)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4890966

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