Transient recovery of minority‐carrier lifetime in silicon after ultraviolet irradiation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.107732
Reference12 articles.
1. Effect of Ultraviolet Light Irradiation on Noncontact Laser Microwave Lifetime Measurement
2. Noncontact minority‐carrier lifetime measurement at elevated temperatures for metal‐doped Czochralski silicon crystals
3. Noncontact minority‐carrier lifetime measurement for magnetic field applied Czochralski silicon crystals
4. Bulk and surface components of recombination lifetime based on a two‐laser microwave reflection technique
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