Reproducible resistance switching characteristics of hafnium oxide-based nonvolatile memory devices
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3041475
Reference33 articles.
1. Nanotechnology enables a new memory growth model
2. Digital memory device based on tobacco mosaic virus conjugated with nanoparticles
3. Data Retention Characteristics of Nitride-Based Charge Trap Memory Devices with High-kDielectrics and High-Work-Function Metal Gates for Multi-Gigabit Flash Memory
4. Nonvolatile nanocrystal charge trap flash memory devices using a micellar route to ordered arrays of cobalt nanocrystals
5. Layer-by-layer assembled charge-trap memory devices with adjustable electronic properties
Cited by 110 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Influence of HfO2 oxide layer on crystallization properties of In3SbTe2 phase change material;Physica Scripta;2024-08-14
2. Analysis of high resistive conduction mechanism in HfO2-based ReRAM devices;2024 IEEE Latin American Electron Devices Conference (LAEDC);2024-05-08
3. Regulated resistive switching behaviors of Pt/Ni0.5Zn0.5Fe2O4/Pt composite films by oxygen pressure;Ceramics International;2024-05
4. Resistive Switching Properties in Memristors for Optoelectronic Synaptic Memristors: Deposition Techniques, Key Performance Parameters, and Applications;ACS Applied Electronic Materials;2023-12-29
5. Memory Devices and Artificial Synapses with 2D Materials;Advanced Memory Technology;2023-10-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3