Current transport mechanism of Au∕Ni∕GaN Schottky diodes at high temperatures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2772182
Reference21 articles.
1. Observation of deep traps responsible for current collapse in GaN metal–semiconductor field-effect transistors
2. Deep impurity transitions involving cation vacancies and complexes in AlGaN alloys
3. Probing deep level centers in GaN epilayers with variable-frequency capacitance-voltage characteristics of Au∕GaN Schottky contacts
4. High temperature characterization of Pt-based Schottky diodes on AlGaN/GaN heterostructures
5. Structural Stability of CaCuMn 6 O 12 under High Pressure and Low Temperature
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