Probing deep level centers in GaN epilayers with variable-frequency capacitance-voltage characteristics of Au∕GaN Schottky contacts
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2358207
Reference14 articles.
1. InGaN Single-Quantum-Well LEDs
2. Influence of premetallization surface treatment on the formation of Schottky Au-nGaN contacts
3. Film thickness degradation of Au/GaN Schottky contact characteristics
4. Electrical characterization of GaN p-n junctions with and without threading dislocations
5. Inhomogeneous spatial distribution of reverse bias leakage in GaN Schottky diodes
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