Electrical performance and reliability analysis of vertical gallium nitride Schottky barrier diodes with dual-ion implanted edge termination
Author:
Li Bo,
Lin Jinpei,
Gao Linfei,
Ma Zhengweng,
Yang HuakaiORCID,
Wu Zhihao,
Chiu Hsien-Chin,
Kuo Hao-Chung,
Zhang ChunfuORCID,
Liu Zhihong,
Huang Shuangwu,
He Wei,
Liu Xinke
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