Capture cross sections of defect states at the Si/SiO2 interface
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.373746
Reference21 articles.
1. Si 2pcore-level shifts at the Si(100)-SiO2interface: An experimental study
2. Microscopic structure of theSiO2/Si interface
3. Defects at the Si/SiO2 interface: Their nature and behaviour in technological processes and stress
4. Conductance measurements onPbcenters at the (111) Si:SiO2interface
5. Characteristic electronic defects at the Si‐SiO2interface
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