Microscopic structure of theSiO2/Si interface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.38.6084/fulltext
Reference78 articles.
1. Chemical and electronic structure of the SiO2/Si interface
2. The thermal oxidation of silicon the special case of the growth of very thin films
3. Electronic structure of defects at Si/SiO2 interfaces
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