Electronic structure of defects at Si/SiO2 interfaces
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Published:1981-09
Issue:3
Volume:19
Page:395-401
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ISSN:0022-5355
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Container-title:Journal of Vacuum Science and Technology
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language:en
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Short-container-title:Journal of Vacuum Science and Technology
Author:
Herman F.,Kasowski R. V.
Publisher
American Vacuum Society
Subject
General Engineering
Cited by
66 articles.
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