Suppression of particle formation by gas-phase pre-reactions in (100) MOVPE-grown β -Ga2O3 films for vertical device application

Author:

Chou Ta-Shun1ORCID,Seyidov Palvan1ORCID,Bin Anooz Saud1ORCID,Grüneberg Raimund1ORCID,Pietsch Mike1,Rehm Jana1ORCID,Tran Thi Thuy Vi1,Tetzner Kornelius2ORCID,Galazka Zbigniew1ORCID,Albrecht Martin1ORCID,Irmscher Klaus1ORCID,Fiedler Andreas1ORCID,Popp Andreas1ORCID

Affiliation:

1. Leibniz-Institut für Kristallzüchtung (IKZ) 1 , Max-Born-Str. 2, 12489 Berlin, Germany

2. Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik 2 , Gustav-Kirchhoff-Straße 4, 12489 Berlin, Germany

Abstract

This work investigated the metalorganic vapor-phase epitaxy (MOVPE) of (100) β-Ga2O3 films with the aim of meeting the requirements to act as drift layers for high-power electronic devices. A height-adjustable showerhead achieving a close distance to the susceptor (1.5 cm) was demonstrated to be a critical factor in increasing the stability of the Ga wetting layer (or Ga adlayer) on the surface and reducing parasitic particles. A film thickness of up to 3 μm has been achieved while keeping the root mean square below 0.7 nm. Record carrier mobilities of 155 cm2 V−1 s−1 (2.2 μm) and 163 cm2 V−1 s−1 (3 μm) at room temperature were measured for (100) β-Ga2O3 films with carrier concentrations of 5.7 × 1016 and 7.1 × 1016 cm−3, respectively. Analysis of temperature-dependent Hall mobility and carrier concentration data revealed a low background compensating acceptor concentration of 4 × 1015 cm−3.

Funder

Bundesministerium für Bildung und Forschung

Deutsche Forschungsgemeinschaft

European Regional Development Fund

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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