The growth optimization and mechanism of N-polar GaN films with an in situ porous SiNx interlayer
Author:
Affiliation:
1. State Key Laboratory on Integrated Optoelectronics
2. College of Electronic Science and Engineering
3. Jilin University
4. Changchun 130012
5. China
6. Institute of Semiconductors
7. Chinese Academy of Science
8. Beijing 100083
Abstract
A model was proposed to explain the epitaxial growth mechanism of N-polar GaN films with an in situ deposited porous SiNx interlayer.
Funder
National Natural Science Foundation of China
Publisher
Royal Society of Chemistry (RSC)
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Link
http://pubs.rsc.org/en/content/articlepdf/2017/CE/C7CE00840F
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