Composition-dependent structural and electrical properties of p-type SnOx thin films prepared by reactive DC magnetron sputtering: effects of oxygen pressure and heat treatment

Author:

Han Sang Jin12345,Kim Sungmin12345,Ahn Joongyu6785,Jeong Jae Kyeong910115,Yang Hoichang6785,Kim Hyeong Joon12345

Affiliation:

1. Department of Materials Science and Engineering

2. Inter-University Semiconductor Research Center

3. Seoul National University

4. Seoul 151-742

5. Republic of Korea

6. Department of Applied Organic Materials Engineering

7. Inha University

8. Incheon 402-751

9. Department of Electronic Engineering

10. Hanyang University

11. Seoul 133-791

Abstract

The composition-dependent structural and electrical properties of p-type SnOx films prepared by reactive DC sputtering at various oxygen partial pressures (PO) and post-heat treatment temperatures (TA) were investigated.

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

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