Structural, Chemical, Optical, and Electrical Evolution of SnOx Films Deposited by Reactive rf Magnetron Sputtering-Reference-Cited by-同舟云学术

Structural, Chemical, Optical, and Electrical Evolution of SnOx Films Deposited by Reactive rf Magnetron Sputtering

Published:2012-10-11 Issue:10 Volume:4 Page:5673-5677
ISSN:1944-8244
Container-title:ACS Applied Materials & Interfaces
language:en
Short-container-title:ACS Appl. Mater. Interfaces

Author:

Luo Hao¹,Liang Ling Yan¹,Cao Hong Tao¹,Liu Zhi Min¹,Zhuge Fei¹

Affiliation:

1. Division of Functional Materials and Nano Devices, Ningbo Institute of Material Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, People’s Republic of China

Publisher

American Chemical Society (ACS)

Subject

General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/am301601s

Reference38 articles.

1. Electrical and optical characterization of Sb : SnO2

2. Tin oxide transparent thin-film transistors

3. Dye Sensitization of Nanocrystalline Tin Oxide by Perylene Derivatives

4. A New Method to Control Particle Size and Particle Size Distribution of SnO2 Nanoparticles for Gas Sensor Applications

5. Synthesis and characterisation of metal suboxides for gas sensors

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