Investigation of block depth distribution in PS-b-PMMA block copolymer using ultra-low-energy cesium sputtering in ToF-SIMS
Author:
Affiliation:
1. CEA, LETI, MINATEC Campus; 17 rue des Martyrs, 38054 Grenoble Cedex 9 France
2. ARKEMA - Groupement de Recherches de Lacq; RN 117, BP34 64170 Lacq France
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. Simple and Versatile Methods To Integrate Directed Self-Assembly with Optical Lithography Using a Polarity-Switched Photoresist
2. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams
3. Molecular depth profiling of polymers with very low energy ions
4. Block Copolymer Nanostructures for Technology
5. Direct top-down ordering of diblock copolymers through nanoimprint lithography
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Dendrite Formation on the Poly(methyl methacrylate) Surface Reactively Sputtered with a Cesium Ion Beam;The Journal of Physical Chemistry B;2022-12-23
2. A Correlative ToF-SIMS/SPM Methodology for Probing 3D Devices;Analytical Chemistry;2020-07-15
3. Nanostructured Films of Oppositely Charged Domains from Self-Assembled Block Copolymers;Macromolecules;2020-07-02
4. Visualizing the Vertical Energetic Landscape in Organic Photovoltaics;Joule;2019-10
5. Development and Synchrotron-Based Characterization of Al and Cr Nanostructures as Potential Calibration Samples for 3D Analytical Techniques;physica status solidi (a);2017-12-07
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3