Molecular depth profiling of polymers with very low energy ions
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference10 articles.
1. Improvements in SIMS continue
2. Molecular depth profiling of multi-layer systems with cluster ion sources
3. Characterization and ion-induced degradation of cross-linked poly(methyl methacrylate) studied using time of flight secondary ion mass spectrometry
4. Molecular depth profiling of organic and biological materials
5. ToF-SIMS analysis of bio-systems: Are polyatomic primary ions the solution?
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