Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams-Reference-Cited by-同舟云学术

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Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams

Published:2009-04-27 Issue:11 Volume:23 Page:1601-1606
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun. Mass Spectrom.

Author:

Ninomiya Satoshi,Ichiki Kazuya,Yamada Hideaki,Nakata Yoshihiko,Seki Toshio,Aoki Takaaki,Matsuo Jiro

Funder

Core Research of Evolutional Science and Technology (CREST) of Japan Science and Technology Agency

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/rcm.4046/fullpdf

Reference31 articles.

1. Ultrahigh resolution secondary ion mass spectrometry profiling with oblique O[sub 2][sup +] beams below 200 eV

2. Optimized time-of-flight secondary ion mass spectroscopy depth profiling with a dual beam technique

3. The Application of Time-of-Flight SIMS for the Surface Characterization of Polymer Latex Particles Prepared with Immobilized Sugar Residues

4. Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene

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