Author:
Benka O.,Geretschläger M.,Paul H.
Cited by
19 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. New trends in ion-beam analysis;Surface Science Reports;1992-11
2. Uses of PIXE at low proton energies;Applied Surface Science;1990-09
3. The role of the ionization and stopping cross sections in PIXE thin film thickness measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-09
4. A comparison between pixe and rbs thin film thickness measurements in binary targets;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-12
5. Depth profiling of brass by means of PIXE;X-Ray Spectrometry;1985-04