Depth profiling of brass by means of PIXE-Reference-Cited by-同舟云学术

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Depth profiling of brass by means of PIXE

Published:1985-04 Issue:2 Volume:14 Page:62-68
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Rössiger V.,Lenk M.

Publisher

Wiley

Subject

Spectroscopy

Reference18 articles.

1. and in Ion Beam Surface Layer Analysis, edited by and p. 735. Plenum, New York (1976).

2. A method of determining the depth of impurities by proton-induced X-rays

3. Using stopping foils for depth determination by particle induced X-ray emission

4. Depth profiling in the near surface region by low energy PIXE

5. Report: Advanced Techniques in Steel Cord-Rubber Adhesion Research. Bekaert, Zweregen (1977).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ion Induced X-ray Emission;Ion Beans for Materials Analysis;1989

2. A Simple Treatment of Secondary Excitation in X-Ray Emission Analysis;Isotopenpraxis Isotopes in Environmental and Health Studies;1987-01

3. Quantitative Analysis of Multicomponent Surface Layers by Means of XRF;Isotopenpraxis Isotopes in Environmental and Health Studies;1985-01

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