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Uses of PIXE at low proton energies

  • Published:1990-09 Issue:2 Volume:45 Page:155-166
  • ISSN:0169-4332
  • Container-title:Applied Surface Science
  • language:en
  • Short-container-title:Applied Surface Science

Author:

Rickards J.,Oliver A.,Miranda J.,Zironi E.P.

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference84 articles.

1. Analytical application of particle induced X-ray emission

2. Proc. Int. Conf. on Particle Induced X-Ray Emission and its Analytical Applications,1977

3. Proc. 4th Int. Conf. on Particle Induced X-Ray Emission and its Analytical Applications,1987

4. Proton induced X-ray emission as a tool for trace element analysis

5. Application of proton-induced X-ray emission to quantitative trace element analysis

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental low velocity proton and 28Siq+ induced X-ray production cross sections for select elements within 24 ≤ Z ≤ 83;Radiation Physics and Chemistry;2023-12

2. Experimental cross sections for L-shell x-ray production and ionization by protons;Atomic Data and Nuclear Data Tables;2014-05

3. Development of a low-energy PIXE analysis system based on an ion implanter;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-01

4. Depth profiling techniques: how PIXE compares to NRP and MEIS?;X-Ray Spectrometry;2011-04-25

5. Evaluation of cross sections for Lα x-ray production by up to 4 MeV protons in representative elements from silver to uranium;Journal of Physics B: Atomic, Molecular and Optical Physics;2009-06-17
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