Full‐range solution for the measurement of thin‐film surface densities with proton‐excited x rays

Author:

Reuter F. William,Smith Harold P.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 52 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. “Total” Ion Beam Analysis-3D Imaging of Complex Samples Using MeV Ion Beams;Characterization of Materials;2012-10-12

2. Electronic stopping cross sections for protons in Al2O3: an experimental and theoretical study;The European Physical Journal D;2012-09

3. Differential PIXE measurements of thin metal layers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06

4. Characterization of the interface between hydroxyapatite coating film and bone: use of a new expression to correct matrix effects for PIXE measurements in thick samples embedded in resin;Journal of Physics D: Applied Physics;2000-02-08

5. Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03

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