The role of the ionization and stopping cross sections in PIXE thin film thickness measurements
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference73 articles.
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Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Evaluation of cross sections for Lα x-ray production by up to 4 MeV protons in representative elements from silver to uranium;Journal of Physics B: Atomic, Molecular and Optical Physics;2009-06-17
2. Total L-shell X-ray production cross sections by 400–700 keV proton impact for elements with 34 ≤ Z ≤ 53;Applied Radiation and Isotopes;2001-03
3. Low energy PIXE: advantages, drawbacks, and applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
4. Uses of PIXE at low proton energies;Applied Surface Science;1990-09
5. Dynamic electrochemistry: methodology and application;Analytical Chemistry;1990-06-15
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