Test patterns reordering method based on Gamma distribution
Author:
Funder
National Natural Science Foundation of China
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
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1. Identifying the Optimal Subsets of Test Items through Adaptive Test for Cost Reduction of ICs;Electronics;2021-03-14
2. Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs;IEICE Electronics Express;2021-01-25
3. Pattern Reorder for Test Cost Reduction Through Improved SVMRANK Algorithm;IEEE Access;2020
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