A new scheme of test data compression based on equal-run-length coding (ERLC)-Reference-Cited by-同舟云学术

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A new scheme of test data compression based on equal-run-length coding (ERLC)

Published:2012-01 Issue:1 Volume:45 Page:91-98
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Zhan Wenfa,El-Maleh Aiman

Funder

Anhui Provincial Natural Science Foundation

Natural Science Foundation of Province College of Anhui

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference52 articles.

1. Testing embedded sequential cores in parallel using spectrum-based BIST;Chen;IEEE Transactions on Computers,2006

2. Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization;Das;IEEE Transactions on Instrumentation and Measurement,2005

3. Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit;Han;IEEE Transactions on Very Large Scale Integration Systems,2007

4. A reconfigurable scan architecture with weighted scan-enable signals for deterministic bist;Xiang;IEEE Transactions on Computer-Aided Design,2008

5. N.A. Touba, E.J. McCluskey, Test point insertion based on path tracing, in: Proceedings of the VLSI Test Symposium, 1996, pp. 2–8.

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