Hybrid encoding for test data compression-Reference-Cited by-同舟云学术

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Hybrid encoding for test data compression

Published:2020-09 Issue: Volume:77 Page:103169
ISSN:0141-9331
Container-title:Microprocessors and Microsystems
language:en
Short-container-title:Microprocessors and Microsystems

Author:

Kalamani C.,Mayilsamy M.,Rukkumani V.,Srinivasan K.,Kumar R. Mohan,Paramasivam K.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software

Reference33 articles.

1. Power-Aware Testing and Test Strategies for Low Power Devices;Girard,2010

2. Multistage encoding for test data compression;Arani,2015

3. VLSI test principles and architectures;Wang,2006

4. ‘Survey of test vector compression techniques;Touba;IEEE Des. Test Comput.,2006

5. Survey of low power testing using compression techniques;Kalamani;Int. J. Electron. Commun. Technol.,2013

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Test response compression using compression perception theory;International Conference on Mechatronic Engineering and Artificial Intelligence (MEAI 2023);2024-02-28

2. A unified test data volume compression scheme for circular scan architecture using hosted cuckoo optimization;The Journal of Supercomputing;2023-10-25

3. On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization;Journal of Electronic Testing;2021-11-19

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