Test data compression scheme based on variable-to-fixed-plus-variable-length coding

Author:

Zhan Wenfa,Liang Huaguo,Shi Feng,Huang Zhengfeng

Publisher

Elsevier BV

Subject

Hardware and Architecture,Software

Reference44 articles.

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3. A. Chandra, K. Chakrabarty, Test resource partitioning and reduced pin-count testing based on test data compression, in: Proceedings of Design, Automation and Test in Europe Conference and Exhibition, 2002, pp. 598–603.

4. Revisiting response compaction in space for full-scan circuits with nonexhaustive test sets using concept of sequence characterization;Das;IEEE Transactions on Instrumentation and Measurement,2005

5. C. Jau-Shien, L. Chen-Shang, Test set compaction for combinational circuits, in: Proceedings of Test Symposium, 1992, pp. 20–25.

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