Author:
Suresh kumar V.,Manimegalai R.
Subject
Artificial Intelligence,Computer Networks and Communications,Hardware and Architecture,Software
Reference27 articles.
1. Survey of low-power testing of VLSI circuits;Girard;IEEE Des. Test. Comput.,2002
2. Survey of test vector compression techniques;Touba;IEEE Des. Test Comput.,2006
3. Test data compression scheme based on variable-to-fixed-plus-variable-length coding;Zhan;J. Syst. Archit.,2007
4. Test data compression using dictionaries with fixed-length indices;Lei,2003
5. Seed encoding for LFSRs and cellular automata;Al-Yamani,2003
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献