A three-dimensional (3D) analytical model for subthreshold characteristics of uniformly doped FinFET
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference28 articles.
1. Strain-Engineered MOSFETs;Maiti,2013
2. Nano-CMOS Gate Dielectric Engineering;Wong,2012
3. Multigate silicon MOSFETs for 45nm node and beyond
4. Fringing fields in sub-0.1 μm fully depleted SOI MOSFETs: optimization of the device architecture
Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The Optimization and Analysis of a Triple-Fin Heterostructure-on-Insulator Fin Field-Effect Transistor with a Stacked High-k Configuration and 10 nm Channel Length;Nanomaterials;2023-11-23
2. Analysis of Underlap Tri-Gate FinFET and Its Capacitance Effects for Analog/Radio Frequency Applications;Journal of Nanoelectronics and Optoelectronics;2023-09-01
3. Dimensional Effect on Analog/RF Performance of Dual Material Gate Junctionless FinFET at 7 nm Technology Node;Transactions on Electrical and Electronic Materials;2023-05-08
4. Performance Analysis of DMG-GOS Junctionless FinFET with high-k Spacer;2022 IEEE Silchar Subsection Conference (SILCON);2022-11-04
5. Design and Optimization of Dual Material Gate Junctionless FinFET Using Dimensional Effect, Gate Oxide and Workfunction Engineering at 7 nm Technology Node;Silicon;2022-03-01
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3