Density functional theory study on the modification of silicon nitride surface by fluorine-containing molecules

Author:

Chowdhury TanziaORCID,Hidayat RomelORCID,Kim Hye-Lee,Mayangsari Tirta Rona,Cho SeongjaeORCID,Park Sangjoon,Jung Jongwan,Lee Won-Jun

Funder

Korea Ministry of Trade Industry and Energy

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference48 articles.

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2. 3D NAND flash based on planar cells;Silvagni;Computers,2017

3. Characterization of the vertical position of the trapped charge in charge-trap flash memory;Kim;J. Semicond. Technol. Sci.,2017

4. Charge trapping properties at silicon nitride/silicon oxide interface studied by variable-temperature electrostatic force microscopy;Tzeng;J. Appl. Phys.,2006

5. Study on self-aligned contact oxide etching using C5F8∕O2∕Ar and C5F8∕O2∕Ar∕CH2F2 plasma;Kim;J. Vac. Sci. Technol. A,2005

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