Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images-Reference-Cited by-同舟云学术

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Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images

Published:2015-03 Issue: Volume:150 Page:1-9
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Coakley K.J.,Imtiaz A.,Wallis T.M.,Weber J.C.,Berweger S.,Kabos P.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference62 articles.

1. Design and fabrication of scanning near-field microwave probes compatible with atomic force microscopy to image embedded nanostructures;Tabib-Azar;IEEE Trans. Microw. Theory Tech.,2004

2. Calibrated nanoscale capacitance measurements using a scanning microwave microscope;Huber;Rev. Sci. Instrum.,2010

3. Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope;Imtiaz;J. Appl. Phys.,2012

4. Quantitative microwave near-field microscopy of dielectric properties;Gao;Rev. Sci. Instrum.,1998

5. Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization;Zhang;Rev. Sci. Instrum.,2010

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1. PLD Growth of InGaAsP Nanowires: Morphology Surface and Structural Property;2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus);2022-01-25

2. Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy;AIP Advances;2021-03-01

3. Key Technologies of Real-time Visualization System for Intelligent Manufacturing Equipment Operating State under IIOT Environment;J INTERNET TECHNOL;2020

4. Disentangling topographic contributions to near-field scanning microwave microscopy images;Ultramicroscopy;2019-02

5. Near-field control and imaging of free charge carrier variations in GaN nanowires;Applied Physics Letters;2016-02-15

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