Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4716026
Reference22 articles.
1. Calibrated nanoscale capacitance measurements using a scanning microwave microscope
2. Principles of Near-Field Microwave Microscopy
3. High-frequency near-field microscopy
4. Scanning nonlinear dielectric microscopy
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