Calibrated nanoscale capacitance measurements using a scanning microwave microscope-Reference-Cited by-同舟云学术

Calibrated nanoscale capacitance measurements using a scanning microwave microscope

Published:2010-11 Issue:11 Volume:81 Page:113701
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Huber H. P.,Moertelmaier M.,Wallis T. M.,Chiang C. J.,Hochleitner M.,Imtiaz A.,Oh Y. J.,Schilcher K.,Dieudonne M.,Smoliner J.,Hinterdorfer P.,Rosner S. J.,Tanbakuchi H.,Kabos P.,Kienberger F.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3491926

Reference24 articles.

1. High-frequency near-field microscopy

2. Principles of Near-Field Microwave Microscopy

3. Quantitative microwave near-field microscopy of dielectric properties

4. 0.4 μm spatial resolution with 1 GHz (λ=30 cm) evanescent microwave probe

5. Tapping mode microwave impedance microscopy

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