Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy-Reference-Cited by-同舟云学术

Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy

Published:2021-03-01 Issue:3 Volume:11 Page:035114
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Zhang Xianfeng¹,Wu Zhe¹^ORCID,Lan Quansong¹^ORCID,Du Zhiliao¹^ORCID,Zhou Quanxin¹,Jiang Ruirui²,Liu Jianlong²^ORCID,Gong Yubin²^ORCID,Zeng Baoqing²^ORCID

Affiliation:

1. School of Physics, University of Electronic Science and Technology of China, Chengdu 611731, China

2. School of Electronics Science and Engineering National Exemplary School of Microelectronics, University of Electronic Science and Technology of China, Chengdu 611731, China

Funder

National Natural Science Foundation of China

Science and Technology Department of Sichuan Province

Fundamental Research Funds for the Central Universities

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0045355

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