Thermal diffusion of Er atoms δ-doped in InP

Author:

Tabuchi M,Fujita K,Tsuchiya J,Fujiwara Y,Takeda Y

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Buried Heterostructure of Nitride Semiconductors Revealed by Laboratory Level X-ray CTR Scattering;Transactions of the Materials Research Society of Japan;2008

2. Study on Buried Interfaces in Semiconductor Heterostructures by X-ray Reflectivity;Transactions of the Materials Research Society of Japan;2007

3. AFM observation of OMVPE grown ErP on InP (001), (111)A and (111)B substrates;Materials Science in Semiconductor Processing;2003-10

4. Crystalline Structure and the Role of Low-Temperature-Deposited AlN and GaN on Sapphire Revealed by X-Ray CTR Scattering and X-Ray Reflectivity Measurements;Surface Review and Letters;2003-04

5. Epitaxy;Encyclopedia of Materials: Science and Technology;2001

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