Sulfurization of InP(001) surfaces studied by X-ray photoelectron and X-ray induced Auger electron spectroscopies (XPS/XAES)
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference16 articles.
1. The sulfurized InP surface
2. X‐ray photoelectron spectroscopy study on InP treated by sulfur containing compounds
3. In situ x-ray photoelectron spectroscopic study of remote plasma enhanced chemical vapor deposition of silicon nitride on sulfide passivated InP
4. Soft x‐ray photoemission characterization of the H2S exposed surface ofp‐InP
5. S‐passivated InP (100)‐(1×1) surface prepared by a wet chemical process
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